fig5

Figure 5. (A) Schematic representation of the sequential acquisition of XPS spectra. (B) Integration of Pt 4f peak intensity at specified sample positions after 100 s of Pt deposition. (C) A representative set of integrated Pt (4f) peak intensities in relation to Pt deposition time. (D) XPS-derived Pt thickness on Ni and Au surfaces. This figure is quoted with permission from Liu et al.^[46]. (E) LSV curve of CP in a 3 mM K₂PtCl₄ and 0.5 M NaCl electrolyte at a scan rate of 5 mV s^-1. Insets exhibit FESEM images after 1 pulse deposition at diverse potentials for 100 s. (F) XPS spectra of C 1s and Pt 4f after 1 pulse deposition at various potentials for 100 s. (G) XPS spectra of C 1s and Pt 4f after 1 pulse deposition at -0.9 V_SCE for different durations. (H) Variation of Pt 4f to C 1s peak area ratio, influenced by the deposition potential or time. This figure is quoted with permission from Kim et al.^[54].